English  |  正體中文  |  简体中文  |  Post-Print筆數 : 11 |  Items with full text/Total items : 88987/118693 (75%)
Visitors : 23570978      Online Users : 287
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    政大機構典藏 > 商學院 > 資訊管理學系 > 會議論文 >  Item 140.119/74460
    Please use this identifier to cite or link to this item: http://nccur.lib.nccu.edu.tw/handle/140.119/74460


    Title: Two kinds of weak-tie strategy for design business opportunity
    Authors: Hong, C.-F.;Lin, Mu-Hua;Yang, Hsiao-Fang;Chiu, T.-F.
    Contributors: 資管系
    Keywords: Business opportunities;Consuming Tribe;Innovation diffusion;Innovative design;Weak-tie;Competition;Design;Innovation;Industry
    Date: 2012
    Issue Date: 2015-04-10 15:35:15 (UTC+8)
    Abstract: Support innovative product to cross chasm or assist design innovative product are very important business opportunity for company to occupy market share. In this paper we propose two kinds use of weak-tie to develop meaningful innovation for increasing companies' competition. © 2012 IEEE.
    Relation: Proceedings - 3rd International Conference on Innovations in Bio-Inspired Computing and Applications, IBICA 2012,329-333
    10.1109/IBICA.2012.37
    Data Type: conference
    DOI 連結: http://dx.doi.org/10.1109/IBICA.2012.37
    DOI: 10.1109/IBICA.2012.37
    Appears in Collections:[資訊管理學系] 會議論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML547View/Open


    All items in 政大典藏 are protected by copyright, with all rights reserved.


    社群 sharing

    著作權政策宣告
    1.本網站之數位內容為國立政治大學所收錄之機構典藏,無償提供學術研究與公眾教育等公益性使用,惟仍請適度,合理使用本網站之內容,以尊重著作權人之權益。商業上之利用,則請先取得著作權人之授權。
    2.本網站之製作,已盡力防止侵害著作權人之權益,如仍發現本網站之數位內容有侵害著作權人權益情事者,請權利人通知本網站維護人員(nccur@nccu.edu.tw),維護人員將立即採取移除該數位著作等補救措施。
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback