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    Title: 專利之品質與價值評量方法—以TFT-LCD產業為例
    The Evaluation Method of Patent Quality and Value-Center on the Industry of TFT-LCD
    Authors: 潘治良
    Pan ,Chih Liang
    Contributors: 劉江彬
    潘治良
    Pan ,Chih Liang
    Keywords: 專利
    品質
    價值
    評量
    Patent
    Quality
    Value
    Evaluation
    Date: 2005
    Issue Date: 2009-09-18 09:38:00 (UTC+8)
    Abstract: 近年來,提昇專利品質的觀念已在企業間蔓延開來,而擁有一套能夠有效衡量的分析評量工具,為企業評估專利價值的先決條件。目前坊間評估專利價值較普遍的方式為CHI Research所發展,以「專利引證資訊」及「專利數量」作為公式的計算基礎。然而專利之品質要素並非現行專利分析公式及其指標所能完全涵蓋及內化,與商業價值亦無直接對應關係。為了改善上述之問題,本研究試圖從實務的觀點出發,找出並分析品質優良之專利說明書,其共通之特色為何,以及如何評估專利實際替企業創造的利益。本研究擬就下列問題進行討論:

    問題一:目前常用的以「專利引證資訊」及「專利說明書可量化數據」為基礎之專利價值評量模式是否可靠?
    問題二:專利的品質與價值如何定義與區分開來評估?
    問題三:影響專利說明書品質之指標因子及流程為何?
    問題四:評估專利價值之流程應為何?
    問題五:由產業結構切入之專利評量模型可行性?

    本研究之架構乃由現有理論基礎配合產業實務,首先將專利之評估方式分成「品質」及「價值」兩階段。接著以TFT-LCD產業之著名訴訟專利及廣視角技術作為研究對象,討論擁有優良品質之專利其特色為何。再連結產業結構、價值鏈、供應鏈、產品結構、技術結構、營收結構等市場面議題以實證專利之價值,並分析探討本研究之專利評量模型可行性。最後,針對提出之問題歸納出研究結論,給予學界及產業界一個專利評量之方法參考。
    In recent years, the concept of improving patent quality is spread over companies and cooperations. Analysis system, as a tool for effectively measuring patent quality, is the prerequisite of patent evaluation. The most general way of patent evaluation is developed by CHI Research, which bases on the information of “patent citation” and “patent quantity” for formulas. However, the essential factor of the patent quality can not be suitably presented by the foregoing indices and formulas. Furthermore, there is no direct relationship between the commercial value and such evaluation process. In order to improve the evaluation process, this research focuses on analyzing the common characteristics of high quality patents and how to value the actual commercial profit earned by patents, form the points of views of practice. Therefore, the objects of the research were to answer the questions as the follows:

    1. Are the existing patent evaluation methodology which base on the information of “patent citation” and “countable indices in patent disclosure” dependable.
    2. How to define and evaluate “patent quality” and “patent value” respectively.
    3. What is the essential factors and evaluation process of patent quality.
    4. What is the evaluation process of patent value.
    5. The feasibility of patent evaluation model initialed from the industrial structure.
    This method of the research combines current theory and industry practice. First, the evaluation process is devided into two steps: “quality” and “value”. Then it takes TFT-LCD industry for example, by analyzing a famous litigation patent and VA technology to discuss the common characteristics of high quality patents. Then, from the business point of view, the research links with several indices such as industry structure, value chain, supply chain, product structure, technology structure and revenue structure to derive the patent value. The feasibility of patent evaluation model by this research will also be discussed. At last, the research summarize the result to present an evaluation methodology of patent quality and value, which may be a useful reference to industry and the academia.
    Reference: 一、中文部分
    1. PIDA,「2006 PIDA成果發表暨記者聯誼會新聞稿全球光電市場與台灣光電產業回顧與展望」http://www.pida.org.tw/pida/060118-newsrelease.doc
    瀏覽日期:2006/6/12
    2. 王信陽(2004/5),「TFT-LCD關鍵材料及零組件供需現況」,光連雙月刊
    3. 友達光電首頁:http://www.auo.com
    瀏覽日期:2006/6/15
    4. 未來產研,「日本三重縣Crystal Valley計劃」光電科技第71期(2005年6月)
    5. 沈耀華、陳錚詒,「15個新台灣大王」,商業週刊(2005年10月號)
    6. 周延鵬(2006),「虎與狐的智慧力」,天下文化
    7. 紀國鐘、鄭晃忠,「液晶顯示器技術手冊」(民國91年10月)
    8. 科技產業資訊室網頁:USPTO公布2005年美國專利核准數前十名(2006/01)
    http://cdnet.stpi.org.tw/techroom/pclass/pclass_A027.htm
    瀏覽日期:2006/3/28
    9. 科技產業資訊室網頁:專利引證(citing)與專利被引證(cited),http://cdnet.stpi.org.tw/techroom/pclass/pclass013.htm
    瀏覽日期:2006/5/1
    10. 科技產業資訊室網頁:關於專利家族,http://cdnet.stpi.org.tw/techroom/pclass/pclass006.htm
    瀏覽日期:2006/5/3
    11. 徐玉娟(2006/02),「Evaluate the players and prospective analysis」, DisplaySearch Taiwan
    12. 陳達仁、黃慕萱、楊牧民(2004)「從美國專利看台灣企業科技創新競爭力」,政大智慧財產評論
    13. 陳玉萍(2004),「專利權運用情境對專利價值因子之影響—以專利權融資、入股及訴訟情境為例」,碩士論文,國立政治大學科技管理研究所
    14. 陳慶逸、白尉芬,「液晶顯示器技術手冊」(民國91年10月)
    15. 麥怡平(2005),「專利侵害判斷與民事審判實務之研究」,碩士論文,世新大學法學研究所
    16. 張孟元(2001),「無形資產中技術價值影響因素與評估模式之研究」,博士論文,國立政治大學資訊管理研究所
    17. 經濟部智慧財產局,http://www.tipo.gov.tw/patent/專利侵害鑑定要點.doc
    瀏覽日期:2006/5/25
    18. 楊瑪利、楊方儒,「專利多,常得獎,台灣已是世界專利大國」,遠見雜誌(2006年3月號)
    19. 葉仰哲(2005/12),「ITIS產業觀察:日本廠商仍主導LCD材料市場」
    20. 劉怡君、李政道,「廣視角液晶模式與材料技術發展」,電子材料第7期
    21. 田山鳥善造,「在大尺寸液晶電視應用上發展優勢性的IPS液晶」,平面顯示器技術及未來發展趨勢—戰略篇(2005年9月),龍璟文化
    22. 簡兆良(2003),「專利資產評估方法研究」,碩士論文,國立政治大學科技管理研究所
    23. 謝榮峻(2004),「TFT-LCD專利的科學關連性分析」,國立中興大學科技管理研究所,碩士論文
    24. 謝勤益(2006/02),「2006 TFT LCD Market Outlook」,DisplaySearch Taiwan
    25. 蕭萬長、蔡清彥,「從日合縱連橫,看台灣LCD業未來」光電科技(2005年6月)
    二、外文部分
    1. “The Value Chain”, http://www.netmba.com/strategy/value-chain
    瀏覽日期:2006/5/25
    2. Aratani. S., Klausmann. H., Ohta. M., Ashizawa. K., and Yanagawa. K. (1996), “Complete Suppression of Color Shift in In-Plane Switching Mode LCDs with a Multidomain Structure Obtained by Unidirectional Rubbing”
    3. Breitzman, Anthony F., Narin, and Francis. (2001), “Method and apparatus for choosing a stock portfolio, based on patent indicators”, United States Patent, 6,175,824
    4. Display Search, “Quarterly Large-Area TFT LCD Shipment Report”, Q1’06 Table
    5. Emmett J. Murtha and Robert A. Myers, “Increasing the Value of a Patent Portfolio”, LesNouvelles Decmber
    6. Eric Lin (2006), “Live large with big screen LCD TVs”, Yuanta Research Center Report
    7. Ernst, H. (1998), “Patent portfolios for strategic R&D planning”, Journal of Engineering and Technology Management
    8. F. Narin, F. Hamilton, K.S. and Olivastro, D. (1997), “The increasing linkage between U.S. Technology and Public Science”, Research Policy
    9. F. Narin and D. Olivastro. (1998), “Linkage between Patents and Papers: an Interim EPO/US Comparison”, Scientometrics
    10. Francis. Narin, Michael B. Albert, Peter Kroll, and Diana Hicks. (2000), “Inventing Our Future: The Link Between Australian Patenting and Basic Science”, Australian Research Council and Commonwealth Scientific and Industrial Research Organization
    11. Gideon Parchmovsky and R. Polk Wagner (2004), “Patent Portfolios”, University of Pennsylvania Law School
    12. Hall, R. et al. (1999). “Market value and patent citations: A first Look”, paper presented at a National Bureau of Economics Research meeting
    13. Hall, R., Jaffe & Trajtenberg. (2001). “Innovation in Israel 1968-1997: A comparative analysis using patent data”, Research Policy
    14. ipIQ公司首頁:http://www.ipiq.com
    瀏覽日期:2006/3/27
    15. John R. Allison, Mark A. Lemley, Kimberly A. Moore and R. D. Trunkey (2003), “Valuable Patents”, Boalt working Papers in Public Law, University of California, Berkeley
    16. Jonathan A. Barney, “Comparative Patent Quality Analysis”
    17. Jonathan A. Barney, NACV White Paper Lerner, Josh (1994). “The Importance of Patent Scope: An Empirical Analysis”, RAND Journal of Economics
    18. McElroy, M.(2002), “Social innovation capital,” Journal of Intellectual Capital
    19. Nakayoshi. Y (2003)., etc, “High Transmittance Pixel Design of IPS TFT LCD”, SID ’03
    20. Patrick H. Sullivan(2001), “Profiting from Intellectual Capital”
    21. Sam Khouy, Joe Daniele, and Paul Germeraad (2001), “Selection and Application of Intellectual Property Valuation Methods In Portfolio Management and Value Extraction”, Les Nouvelles September 2001
    22. S. Kataoka, A. Takeda, H. Tsuda, and Y. Koike (2001), ”A New MVA-LCD with Jagged Shaped Pixel Electrodes”, SID 01
    23. Sheldon and Mak, “DAMAGES IN PATENT SUITS”, http://www.usip.com/articles/dmgespat.htm
    瀏覽日期:2006/6/29
    24. The World Bank (2005), “States and Markets – Science and technology”, 05 World Development Indicators
    25. Trajenberg, M. (1990). “A penny for your quotes: Patent citations and the value of innovations
    26. Verbeek, A. Debackere, K., Luwel, M., Andries, P., Zimmermann, E., Deleus, F. (2002), ”Linkage Science to Technology: Using Bibliographic references in Patents to Build Linkage Schemes”, Scientometrics
    27. Yoshio Koike and Kenji Okamoto (1999), “Super High Quality MVA-TFT Liquid Crystal Displays”, Fujitsu Sci. Tech.
    28. Wikipedia website:http://en.wikipedia.org/wiki/Quality and http://en.wikipedia.org/wiki/Value
    瀏覽日期:2006/5/14
    29. World Economic Forum.(2005)“Global Competitiveness Report 2005-2006”
    30. 日本特許廳http://www.jpo.go.jp/torikumi/hiroba/pdf/tt1212-035.pdf
    瀏覽日期:2006/4/18
    Description: 碩士
    國立政治大學
    科技管理研究所
    92359039
    94
    Source URI: http://thesis.lib.nccu.edu.tw/record/#G0923590391
    Data Type: thesis
    Appears in Collections:[科技管理研究所] 學位論文

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